Abstract. Application Specific Integrated Circuits (ASICs) have been, for a long time, the best, and sometimes only, option when there was a need for high performance electronics while operating with tight constraints regarding communication bandwidth, speed and/or latency, low power consumption and other, more specialized requirements, such as radiation hardness. To make sure that all ASICs that are going to be used in electronics parts installed on experimental physics detectors are working properly, they need to be thoroughly tested and their testing results need to be stored and used for manufacturing traceability purposes. A test bench solution which allows identifying and eliminating sources of errors during the integration of ASICs in detector electronics based on machine vision and test automation procedures has been designed for this purpose and is being presented.

Key words: Integrated circuit testing, electronics testing, machine vision, test automation.